_______________________________ WORKSHOP 2 28 & 29 June , 2007. SWISSOTEL THE STAMFORD, SINGAPORE
A B O U T T H E W O R K S H O P
The objective of this workshop is to educate the participants into the key aspects of DCA. Firstly the workshop will cover and provide an understanding of the selection criterion and considerations for bare dies, their quality and acquisition considerations. The standards governing this area will be reviewed in terms of impacts to both manufacturers and producers. The second part of the workshop will deal with the two aspects of DCA namely Flip Chip (FC) and Chip-On-Board (COB). Both attachment technologies will be dealt with in terms of positioning, design guidelines and attachment considerations, usage, equipment, process development and analysis with real life examples
MODULE 1 – DIRECT CHIP ATTACHMENT Overview Pro’s & Con’s Applications Cost Factors Foot Print Efficiency Flip Chip Vs. Chip-On-Board MODULE 2 – BARE DIES Selection Quality Considerations Known Good Die (KGD) & Unknown Bad Die (UBD) Procurement Standards Road Map MODULE 3 – FLIP CHIP DESIGN RULES Bump Pitches Bump Heights Edge Clearance Array Vs. Peripherals Types of Under Bump Metallization (UBMs) UBM Parameters Bumping Processes Bump Shear Strengths MODULE 4 – FLIP CHIP ATTACHMENT Merging with SMT Process Process Flow Options Understanding Underfills Underfilling Trends Developing & Qualifying The Process Reworking Flip Chip
MODULE 1 – DIRECT CHIP ATTACHMENT Overview Pro’s & Con’s Applications Cost Factors Foot Print Efficiency Flip Chip Vs. Chip-On-Board
MODULE 2 – BARE DIES Selection Quality Considerations Known Good Die (KGD) & Unknown Bad Die (UBD) Procurement Standards Road Map
MODULE 3 – FLIP CHIP DESIGN RULES Bump Pitches Bump Heights Edge Clearance Array Vs. Peripherals Types of Under Bump Metallization (UBMs) UBM Parameters Bumping Processes Bump Shear Strengths
MODULE 4 – FLIP CHIP ATTACHMENT Merging with SMT Process Process Flow Options Understanding Underfills Underfilling Trends Developing & Qualifying The Process Reworking Flip Chip
MODULE 5 – RELIABILITY & ANALYSIS Reliability Factors Failure Mechanisms & Modes Electromigration Micro-sectioning – How To’s Analyzing Failures MODULE 6 – CHIP-ON-BOARD Applications Positioning Design Rules – Pad Design & Layout Design Examples MODULE 7 – ATTACHMENT Bonding Process Ball Bonding Vs. Wedge Tools & Equipment Bonding Variables Merging COB In SMT Process Flow Options Pro’s & Con’s Reworking Chip-On-Board MODULE 8 – CONCLUSION Summary of Key DCA Success Factors Future Reading Information Resources References
MODULE 5 – RELIABILITY & ANALYSIS Reliability Factors Failure Mechanisms & Modes Electromigration Micro-sectioning – How To’s Analyzing Failures
MODULE 6 – CHIP-ON-BOARD Applications Positioning Design Rules – Pad Design & Layout Design Examples
MODULE 7 – ATTACHMENT Bonding Process Ball Bonding Vs. Wedge Tools & Equipment Bonding Variables Merging COB In SMT Process Flow Options Pro’s & Con’s Reworking Chip-On-Board
MODULE 8 – CONCLUSION Summary of Key DCA Success Factors Future Reading Information Resources References
This is a high level program to address the needs of a range of industries, primarily SMT that are involved with DCA, but certainly include many back-end and packaging areas that deploy DCA as an enabling technology in the manufacturing of BGAs, CSPs and other Micro Array Devices, etc. The latter will also benefit from understanding how the SMT industry perceives bare dies usage in embedding into SMT as well as use of these technologies as enablers in packaging products. The target audience will comprise personnel from Engineering, Process, Manufacturing, Assembly, Failure Analysis and Quality disciplines